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Issue DateTitleAuthor(s)
1-Dec-1984Reconstruction of the SiO2 structure damaged by low-energy Ar-implanted ionsGarrido Fernández, Blas; Samitier i Martí, Josep; Bota Ferragut, Sebastián Antonio; Moreno, J. A.; Montserrat i Martí, Josep; Morante i Lleonart, Joan Ramon
1986Analysis of the near-intrinsic and extrinsic photocapacitance due to the EL2 level in boron implanted GaAsMorante i Lleonart, Joan Ramon; Samitier i Martí, Josep; Pérez Rodríguez, Alejandro; Altelarrea Soria, Hermenegildo; Gourrier, S.
1986Majority carrier capture cross section determination in the large deep trap concentration casesMorante i Lleonart, Joan Ramon; Samitier i Martí, Josep; Cornet i Calveras, Albert; Herms Berenguer, Atilà; Cartujo Estébanez, Pedro