Browsing by Author Canillas i Biosca, Adolf
Showing results 1 to 20 of 25
next >
| Issue Date | Title | Author(s) |
|---|---|---|
| 28-Sep-2006 | Comportament elèctric, tèrmic, òptic i magnètic dels materials | Canillas i Biosca, Adolf |
| 17-Dec-2010 | Detection and characterization of single nanoparticles by interferometric phase modulated ellipsometry | Barroso, F.; Bosch i Puig, Salvador; Tort Escribà, Núria; Arteaga Barriel, Oriol; Sancho i Parramon, Jordi; Jover, Eric; Bertrán Serra, Enric; Canillas i Biosca, Adolf |
| 2009 | Determination of the components of the gyration tensor of quartz by oblique incidence transmission two-modulator generalized ellipsometry | Arteaga Barriel, Oriol; Canillas i Biosca, Adolf; Jellison, Gerald E. |
| 1991 | Effect of substrate temperature on deposition rate of rf plasma-deposited hydrogenated amorphous silicon thin films | Andújar Bella, José Luis; Bertrán Serra, Enric; Canillas i Biosca, Adolf; Campmany i Guillot, Josep, 1966-; Morenza Gil, José Luis |
| 2004 | Elaboració d'una base de dades per a l'autoformació i autoavaluació de coneixements i competències en estudis científics superiors | Canillas i Biosca, Adolf; Ferrater Martorell, Cèsar; Varela Fernández, Manuel, 1956-; Bertomeu i Balagueró, Joan; Pascual Miralles, Esther |
| 1991 | Ellipsometric study of a-Si:H thin films deposited by square wave modulated rf glow discharge | Lloret, A.; Bertrán Serra, Enric; Andújar Bella, José Luis; Canillas i Biosca, Adolf; Morenza Gil, José Luis |
| Aug-1997 | In situ fast ellipsometric analysis of repetitive surface phenomena | Campmany i Guillot, Josep, 1966-; Costa i Balanzat, Josep; Canillas i Biosca, Adolf; Andújar Bella, José Luis; Bertrán Serra, Enric |
| 1990 | In situ spectroellipsometric study of the nucleation and growth of amorphous silicon | Canillas i Biosca, Adolf; Bertrán Serra, Enric; Andújar Bella, José Luis; Drévillon, B. |
| Mar-1987 | Influence of pressure and radio frequency power on deposition rate and structural properties of hydrogenated amorphous silicon thin films prepared by plasma deposition | Andújar Bella, José Luis; Bertrán Serra, Enric; Canillas i Biosca, Adolf; Roch i Cunill, Carles; Morenza Gil, José Luis |
| 9-Jun-2012 | Kinetic control of the supramolecular chirality of porphyrin J-aggregates | Sorrenti, Alessandro; El Hachemi, Zoubir; Arteaga Barriel, Oriol; Canillas i Biosca, Adolf; Crusats i Aliguer, Joaquim; Ribó i Trujillo, Josep M. |
| 1996 | L'el·lipsometria, una eina de caracterització òptica dels materials | Canillas i Biosca, Adolf; Campmany i Guillot, Josep, 1966-; Pascual Miralles, Esther; Bertrán Serra, Enric |
| 19-Dec-2019 | Mathematical work on the foundation of Jones-Mueller formalism and its application to nano optics | Kuntman, Ertan |
| 1-Apr-2014 | Mueller matrix microscope with a dual continuous rotating compensator setup and digital demodulation | Arteaga Barriel, Oriol; Baldrís Calmet, Marta; Antó Roca, Joan; Canillas i Biosca, Adolf; Pascual Miralles, Esther; Bertrán Serra, Enric |
| 6-Oct-2010 | Mueller matrix polarimetry of anisotropic chiral media | Arteaga Barriel, Oriol |
| 1998 | Numerical algorithm for spectroscopic ellipsometry of thick transparent films | Bosch i Puig, Salvador; Pérez Tudela, Julio D.; Canillas i Biosca, Adolf |
| 18-Jul-2008 | On the mechano-chiral effect of vortical flows on the dichroic spectra of 5-phenyl-10,15,20-tris(4-sulfonatophenyl)porphyrin J-aggregates | El Hachemi, Zoubir; Arteaga Barriel, Oriol; Canillas i Biosca, Adolf; Crusats i Aliguer, Joaquim; Escudero Rodríguez, Carlos; Kuroda, Reiko; Harada, Takunori; Rosa Expósito, Mònica; Ribó i Trujillo, Josep M. |
| 22-Oct-2015 | Optical security verification by synthesizing thin films with unique polarimetric signatures | Carnicer González, Arturo; Arteaga Barriel, Oriol; Pascual Miralles, Esther; Canillas i Biosca, Adolf; Vallmitjana i Rico, Santiago; Javidi, Bahram; Bertrán Serra, Enric |
| Aug-1993 | Phase-modulated ellipsometer using a Fourier transform infrared spectrometer for real time applications | Canillas i Biosca, Adolf; Pascual Miralles, Esther; Drévillon, B. |
| 1992 | Properties of amorphous silicon thin films grown in square wave modulated silane rf discharges. | Andújar Bella, José Luis; Bertrán Serra, Enric; Canillas i Biosca, Adolf; Campmany i Guillot, Josep, 1966-; Serra-Miralles, J.; Roch i Cunill, Carles; Lloret, A. |
| 27-Jan-2016 | Relation between 2D/3D chirality and the appearence of chiroptical effects in real nanostructures. | Arteaga Barriel, Oriol; Sancho i Parramon, Jordi; Nichols, Shane; Maoz, Ben M.; Canillas i Biosca, Adolf; Bosch i Puig, Salvador; Markovich, Gil; Kahr, Bart |