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Title: Atomic force microscopy: probing the nanoworld
Author: Oncins Marco, Gerard
Díaz Marcos, Jordi
Keywords: Microscòpia de força atòmica
Anàlisi instrumental
Atomic force microscopy
Instrumental analysis
Issue Date: 2012
Publisher: Centres Científics i Tecnològics. Universitat de Barcelona
Abstract: Atomic Force Microscope and related techniques have played a key role in the development of the nanotechnology revolution that is taking place in science. This paper reviews the basic principles behind the technique and its different operation modes and applications, pointing out research works performed in the Nanometric Techniques Unit of the CCiTUB in order to exemplify the vast array of capabilities of these instruments.
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Note: Reproducció del document original
It is part of: Capítol del llibre: Handbook of instrumental techniques for materials, chemical and biosciences research, Centres Científics i Tecnològics. Universitat de Barcelona, Barcelona, 2012. Part I. Materials technologies (MT), MT.7, 10 p.
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Appears in Collections:Llibres / Capítols de llibre (Centres Científics i Tecnològics de la Universitat de Barcelona (CCiTUB))

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