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https://hdl.handle.net/2445/32162| Title: | Atomic force microscopy: probing the nanoworld |
| Author: | Oncins Marco, Gerard Díaz Marcos, Jordi |
| Keywords: | Microscòpia de força atòmica Nanotecnologia Anàlisi instrumental Atomic force microscopy Nanotechnology Instrumental analysis |
| Issue Date: | 2012 |
| Publisher: | Centres Científics i Tecnològics. Universitat de Barcelona |
| Abstract: | Atomic Force Microscope and related techniques have played a key role in the development of the nanotechnology revolution that is taking place in science. This paper reviews the basic principles behind the technique and its different operation modes and applications, pointing out research works performed in the Nanometric Techniques Unit of the CCiTUB in order to exemplify the vast array of capabilities of these instruments. |
| Note: | Podeu consultar el llibre complet a: http://hdl.handle.net/2445/32166 |
| Note: | Reproducció del document original |
| It is part of: | Capítol del llibre: Handbook of instrumental techniques for materials, chemical and biosciences research, Centres Científics i Tecnològics. Universitat de Barcelona, Barcelona, 2012. Part I. Materials technologies (MT), MT.7, 10 p. |
| URI: | https://hdl.handle.net/2445/32162 |
| Related resource: | http://hdl.handle.net/2445/32166 |
| Appears in Collections: | Llibres / Capítols de llibre (Centres Científics i Tecnològics de la Universitat de Barcelona (CCiTUB)) |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| MT07 - Atomic Force Microscopy_ed2.pdf | 2.57 MB | Adobe PDF | View/Open |
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