Charge Transfer Characteristics of n-type In0.1Ga0.9N Photoanode across Semiconductor-Liquid Interface

dc.contributor.authorCaccamo, Lorenzo
dc.contributor.authorFábrega, Cristian
dc.contributor.authorMarschewski, Marcel
dc.contributor.authorFündling, Sönke
dc.contributor.authorGad, Alaaeldin
dc.contributor.authorCasals Guillén, Olga
dc.contributor.authorLilienkamp, Gerhard
dc.contributor.authorHofft, Oliver
dc.contributor.authorPrades García, Juan Daniel
dc.contributor.authorDaum, Winfried
dc.contributor.authorWaag, Andreas
dc.date.accessioned2017-03-09T15:44:08Z
dc.date.available2017-12-29T23:01:21Z
dc.date.issued2016-12-29
dc.date.updated2017-03-09T15:44:08Z
dc.description.abstractUnderstanding the mechanisms of charge transfer across the semiconductor/liquid interface is crucial to realize efficient photoelectrochemical devices. Here, the interfacial charge transfer characteristics of n-type In0.1Ga0.9N photoanodes are investigated and correlated to their photo-activity properties measured in phosphate buffered saline solution (pH 7) under illumination conditions. Cyclic voltammetry measurements show evident photoactivity changes as the number of cycles increases. In particular, the photocurrent density reaches its maximum value after 49 voltammetric cycles; meanwhile, the photocurrent onset potential shifts toward more negative cathodic potentials. Electrochemical impedance measurements reveal that, first, the hole transfer process occurs mainly via localized states at the surface and the photocurrent onset potential is dependent on the energetic position of those states. Therefore, the observed initial photocurrent increase and cathodic shift of the photocurrent onset potential can be attributed to a decrease of the transfer resistance and partial passivation of the states at the surface. On the other hand, a gradual oxidation and corrosion of the InGaN surface arises, causing a consequential decrease of the photocurrent. At this point, the charge transfer process occurs predominantly from the valence band. This work provides a basic understanding of the charge transfer mechanisms across the InGaN/liquid interface which can be used to improve the overall photoanode efficiency.
dc.format.extent7 p.
dc.format.mimetypeapplication/pdf
dc.identifier.idgrec669251
dc.identifier.issn1932-7447
dc.identifier.urihttps://hdl.handle.net/2445/108189
dc.language.isoeng
dc.publisherAmerican Chemical Society
dc.relation.isformatofVersió postprint del document publicat a: https://doi.org/10.1021/acs.jpcc.6b09256
dc.relation.ispartofJournal of Physical Chemistry C, 2016, vol. 120, num. 51, p. 28917-28923
dc.relation.urihttps://doi.org/10.1021/acs.jpcc.6b09256
dc.rights(c) American Chemical Society , 2016
dc.rights.accessRightsinfo:eu-repo/semantics/openAccess
dc.sourceArticles publicats en revistes (Enginyeria Electrònica i Biomèdica)
dc.subject.classificationDetectors de gasos
dc.subject.classificationSemiconductors
dc.subject.classificationTransferència de càrrega
dc.subject.otherGas detectors
dc.subject.otherSemiconductors
dc.subject.otherCharge transfer
dc.titleCharge Transfer Characteristics of n-type In0.1Ga0.9N Photoanode across Semiconductor-Liquid Interface
dc.typeinfo:eu-repo/semantics/article
dc.typeinfo:eu-repo/semantics/acceptedVersion

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