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2016-06-28

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cc-by (c) Yedra Cardona, Lluís et al., 2016
Please use this identifier to cite or link to this item: https://hdl.handle.net/2445/126163

In-situ isotopic analysis at nanoscale using parallel ion electron spectrometry: a powerful new paradigm for correlative microscopy

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https://doi.org/10.1038/srep28705

Abstract

Isotopic analysis is of paramount importance across the entire gamut of scientific research. To advance the frontiers of knowledge, a technique for nanoscale isotopic analysis is indispensable. Secondary Ion Mass Spectrometry (SIMS) is a well-established technique for analyzing isotopes, but its spatial-resolution is fundamentally limited. Transmission Electron Microscopy (TEM) is a well-known method for high-resolution imaging down to the atomic scale. However, isotopic analysis in TEM is not possible. Here, we introduce a powerful new paradigm for in-situ correlative microscopy called the Parallel Ion Electron Spectrometry by synergizing SIMS with TEM. We demonstrate this technique by distinguishing lithium carbonate nanoparticles according to the isotopic label of lithium, viz. 6Li and 7Li and imaging them at high-resolution by TEM, adding a new dimension to correlative microscopy.

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Isòtops, Microscòpia electrònica de transmissió, Espectroscòpia de pèrdua d'energia d'electrons

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Isotopes, Transmission electron microscopy, Electron energy loss spectroscopy

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Articles publicats en revistes (Enginyeria Electrònica i Biomèdica)

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YEDRA CARDONA, Lluís, et al. In-situ isotopic analysis at nanoscale using parallel ion electron spectrometry: a powerful new paradigm for correlative microscopy. Scientific Reports. 2016. Vol. 6, num. 28705. ISSN 2045-2322. [consulted: 13 of August of 2026]. Available at: https://hdl.handle.net/2445/126163

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