Analysis of samples based on a polarization microscope technique

Abstract

The aim of this paper is to study a transparent birefringent sample with a polarizer microscope, we measure orientation of optic axis of the sample and phase retardation. We make a polarizer microscope using a generated polarized beam. With a Mach-Zehnder setup we control polarized state of the beam. We use a Spatial Light Modulator to modulate X and Y components independently. The polarized beam illuminates the birefringent samples and passes through a circular polarizer. Intensity values captured with a CCD camera show us the sample information. We obtain the orientation of fast axis of birefringent sample