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Article

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Accepted version

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2014

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Please use this identifier to cite or link to this item: https://hdl.handle.net/2445/98783

Metal island film-based structures for sensing using spectrophotometry and ellipsometry

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http://dx.doi.org/10.1007/s00339-013-8056-x

Abstract

Metal island films (MIF) are good candidates for sensors due to the strong sensitivity of the localised surface plasmon resonance to the environment refractive index. The strong near field enhancement in the vicinity of the island surface can be even higher if a metal layer (ML) is placed close to a MIF. Structures containing MIF with and without ML are prepared and sensitivities of spectrophotometric and ellipsometric features of the measurements are compared. It is shown that simple MIF is preferable for ellipsometry-based sensing and the one including ML in the case of spectrophotometric measurements.

Subject

Ressonància de plasmons superficials, Pel·lícules metàl·liques, El·lipsometria

Subject (English)

Surface plasmon resonance, Metallic films, Ellipsometry

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Articles publicats en revistes (Física Aplicada)

Citation

JANICKI, V., et al. Metal island film-based structures for sensing using spectrophotometry and ellipsometry. Applied Physics A-Materials Science & Processing. 2014. Vol. 115, num. 2, pags. 481-486. ISSN 0947-8396. [consulted: 11 of August of 2026]. Available at: https://hdl.handle.net/2445/98783

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