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MT10 - Secondary Ion Mass Spectrometry_ed2.pdf (1.02 MB)

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Book part

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Published version

Publication date

2012

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Please use this identifier to cite or link to this item: https://hdl.handle.net/2445/32165

Secondary Ion Mass Spectrometry (SIMS): principles and applications

Journal Title

Authors

Director/Tutor

Journal ISSN

Volume Title

Related resource

http://hdl.handle.net/2445/32166

Abstract

This article outlines the basis of the technique and shows some examples of applications in order to exhibit the expectations of this technique in varied scientific fields.

Description

Podeu consultar el llibre complet a: http://hdl.handle.net/2445/32166

Subject

Espectrometria de masses, Anàlisi instrumental

Subject (English)

Mass spectrometry, Instrumental analysis

Citation

Collections

Llibres / Capítols de llibre (Centres Científics i Tecnològics de la Universitat de Barcelona (CCiTUB))

Citation

LÓPEZ FERNÁNDEZ, Francisco. Secondary Ion Mass Spectrometry (SIMS): principles and applications. Capítol del llibre: Handbook of instrumental techniques for materials. chemical and biosciences research. Vol. Universitat de Barcelona, num. Barcelona, pags. Part I. [consulted: 6 of June of 2026]. Available at: https://hdl.handle.net/2445/32165

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