Secondary Ion Mass Spectrometry (SIMS): principles and applications
| dc.contributor.author | López Fernández, Francisco | |
| dc.date.accessioned | 2012-10-01T08:31:55Z | |
| dc.date.available | 2012-10-01T08:31:55Z | |
| dc.date.issued | 2012 | |
| dc.description | Podeu consultar el llibre complet a: http://hdl.handle.net/2445/32166 | |
| dc.description.abstract | This article outlines the basis of the technique and shows some examples of applications in order to exhibit the expectations of this technique in varied scientific fields. | eng |
| dc.format.extent | 14 p. | |
| dc.format.mimetype | application/pdf | |
| dc.identifier.uri | https://hdl.handle.net/2445/32165 | |
| dc.language.iso | eng | eng |
| dc.publisher | Centres Científics i Tecnològics. Universitat de Barcelona | cat |
| dc.relation.isformatof | Reproducció del document original | |
| dc.relation.ispartof | Capítol del llibre: Handbook of instrumental techniques for materials, chemical and biosciences research, Centres Científics i Tecnològics. Universitat de Barcelona, Barcelona, 2012. Part I. Materials technologies (MT), MT.10, 14 p. | |
| dc.relation.uri | http://hdl.handle.net/2445/32166 | |
| dc.rights | (c) Universitat de Barcelona, 2012 | |
| dc.rights.accessRights | info:eu-repo/semantics/openAccess | eng |
| dc.source | Llibres / Capítols de llibre (Centres Científics i Tecnològics de la Universitat de Barcelona (CCiTUB)) | |
| dc.subject.classification | Espectrometria de masses | cat |
| dc.subject.classification | Anàlisi instrumental | cat |
| dc.subject.other | Mass spectrometry | eng |
| dc.subject.other | Instrumental analysis | eng |
| dc.title | Secondary Ion Mass Spectrometry (SIMS): principles and applications | eng |
| dc.type | info:eu-repo/semantics/bookPart | eng |
| dc.type | info:eu-repo/semantics/publishedVersion |
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