Amb motiu del tancament d'estiu, la validació de documents es reprendrà a partir del 28 d'agost de 2026. Disculpeu les molèsties.
Con motivo del cierre de verano, la validación de documentos se reanudará a partir del 28 de agosto de 2026. Disculpad las molestias
Due to the summer closure, document validation will resume starting August 28, 2026. We apologize for any inconvenience.

Files

film.jar (110.38 KB)
film_en.html (1.84 KB)

Document type

Other

Publication date

2010-11-24

Publication license

cc-by-nc-sa (c) Andilla i Salla, Jordi et al., 2010
Please use this identifier to cite or link to this item: https://hdl.handle.net/2445/14584

Applet of multiple beam interference

Journal Title

Authors

Director/Tutor

Journal ISSN

Volume Title

Related resource

http://hdl.handle.net/2445/14329
 http://hdl.handle.net/2445/14389
 http://www.ub.edu/javaoptics/index-en.html

Abstract

This applet shows multiple beam interferences from a parallel dielectric thin film. The applet lets you study the evolution of reflection and refraction factors when the index of refraction and the absorption of the film and the substrate are modified. These can be constant or have a wavelength dependency.

Description

Part of Joptics, an ensemble of teaching resources for Physical Optics at university level as part of physics or optics and optometry studies. http://www.ub.edu/javaoptics/index-en.html
Podeu consultar la versió en català a: http://hdl.handle.net/2445/14329 ; i en castellà a: http://hdl.handle.net/2445/14389

Subject

Óptica física, Java (Llenguatge de programació)

Subject (English)

Citation

Collections

OMADO (Objectes i MAterials DOcents)

Citation

ANDILLA I SALLA, Jordi, et al. Applet of multiple beam interference. [consulted: 17 of August of 2026]. Available at: https://hdl.handle.net/2445/14584

Export metadata

JSON - METS

Share record