Dijous 11 de juny, el Dipòsit Digital no estarà operatiu de 15:00 a 17:00 h per tasques de manteniment. Disculpeu les molèsties.
El jueves 11 de Junio, el Dipòsit Digital no estará operativo de 15:00 a 17:00 h debido a tareas de mantenimiento. Disculpen las molestias.
Thursday, Jun 11th, the Digital Repository will be unavailable due to a system update.

Files

MT07 - Atomic Force Microscopy_ed2.pdf (2.51 MB)

Document type

Book part

Version

Published version

Publication date

2012

All rights reserved

Please use this identifier to cite or link to this item: https://hdl.handle.net/2445/32162

Atomic force microscopy: probing the nanoworld

Journal Title

Authors

Director/Tutor

Journal ISSN

Volume Title

Related resource

http://hdl.handle.net/2445/32166

Abstract

Atomic Force Microscope and related techniques have played a key role in the development of the nanotechnology revolution that is taking place in science. This paper reviews the basic principles behind the technique and its different operation modes and applications, pointing out research works performed in the Nanometric Techniques Unit of the CCiTUB in order to exemplify the vast array of capabilities of these instruments.

Description

Podeu consultar el llibre complet a: http://hdl.handle.net/2445/32166

Subject

Microscòpia de força atòmica, Nanotecnologia, Anàlisi instrumental

Subject (English)

Atomic force microscopy, Nanotechnology, Instrumental analysis

Citation

Collections

Llibres / Capítols de llibre (Centres Científics i Tecnològics de la Universitat de Barcelona (CCiTUB))

Citation

ONCINS MARCO, Gerard and DÍAZ MARCOS, Jordi. Atomic force microscopy: probing the nanoworld. Capítol del llibre: Handbook of instrumental techniques for materials. chemical and biosciences research. Vol. Universitat de Barcelona, num. Barcelona, pags. Part I. [consulted: 10 of June of 2026]. Available at: https://hdl.handle.net/2445/32162

Export metadata

JSON - METS

Share record