El Dipòsit Digital ha actualitzat el programari. Qualsevol incidència que trobeu si us plau contacteu amb dipositdigital@ub.edu.

 

Advanced applications of scanning electron microscopy in geology

dc.contributor.authorGarcía Veigas, Francisco Javier
dc.contributor.authorPrats Miralles, Eva
dc.contributor.authorDomínguez Ximénez, Anna
dc.contributor.authorVilluendas Latorre, Aránzazu
dc.date.accessioned2012-09-28T14:15:14Z
dc.date.available2012-09-28T14:15:14Z
dc.date.issued2012
dc.descriptionPodeu consultar el llibre complet a: http://hdl.handle.net/2445/32166
dc.description.abstractNowadays Scanning Electron Microscopy (SEM) is a basic and fundamental tool in the study of geologic samples. The collision of a highlyaccelerated electron beam with the atoms of a solid sample results in the production of several radiation types than can be detected and analysed by specific detectors, providing information of the chemistry and crystallography of the studied material. From this point of view, the chamber of a SEM can be considered as a laboratory where different experiments can be carried out. The application of SEM to geology, especially in the fields of mineralogy and petrology has been summarised by Reed (1996).The aim of this paper is to show some recent applications in the characterization of geologic materials.eng
dc.format.extent10 p.
dc.format.mimetypeapplication/pdf
dc.identifier.urihttps://hdl.handle.net/2445/32147
dc.language.isoengeng
dc.publisherCentres Científics i Tecnològics. Universitat de Barcelonacat
dc.relation.isformatofReproducció del document original
dc.relation.ispartofCapítol del llibre: Handbook of instrumental techniques for materials, chemical and biosciences research, Centres Científics i Tecnològics. Universitat de Barcelona, Barcelona, 2012. Part I. Materials technologies (MT), MT.5, 12 p.
dc.relation.urihttp://hdl.handle.net/2445/32166
dc.rights(c) Universitat de Barcelona, 2012
dc.rights.accessRightsinfo:eu-repo/semantics/openAccesseng
dc.sourceLlibres / Capítols de llibre (Centres Científics i Tecnològics de la Universitat de Barcelona (CCiTUB))
dc.subject.classificationMicroscòpia electrònica d'escombratgecat
dc.subject.classificationGeologiacat
dc.subject.classificationAnàlisi instrumentalcat
dc.subject.otherScanning electron microscopyeng
dc.subject.otherGeologyeng
dc.subject.otherInstrumental analysiseng
dc.titleAdvanced applications of scanning electron microscopy in geologyeng
dc.typeinfo:eu-repo/semantics/bookParteng
dc.typeinfo:eu-repo/semantics/publishedVersion

Fitxers

Paquet original

Mostrant 1 - 1 de 1
Carregant...
Miniatura
Nom:
MT05 - Advanced applications of SEM_ed2.pdf
Mida:
2.16 MB
Format:
Adobe Portable Document Format