Spectroscopic ellipsometry study of Cu2ZnSnSe4 bulk crystals

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dc.contributor.authorLeón, Máximo
dc.contributor.authorLevcenko, Sergiu
dc.contributor.authorSerna, Rosalía
dc.contributor.authorBodnar, Ivan V.
dc.contributor.authorNateprov, A.
dc.contributor.authorGuc, Maxim
dc.contributor.authorGurieva, G.
dc.contributor.authorLopez, N.
dc.contributor.authorMerino, José Manuel
dc.contributor.authorCaballero, Raquel
dc.contributor.authorSchorr, S.
dc.contributor.authorPérez Rodríguez, Alejandro
dc.contributor.authorArushanov, Ernest
dc.date.accessioned2018-09-26T10:40:18Z
dc.date.available2018-09-26T10:40:18Z
dc.date.issued2014-08-15
dc.date.updated2018-09-26T10:40:18Z
dc.description.abstractUsing spectroscopic ellipsometry we investigated and analyzed the pseudo-optical constants of Cu2ZnSnSe4 bulk crystals, grown by the Bridgman method, over 0.8-4.5 eV photon energy range. The structures found in the spectra of the complex pseudodielectric functions were associated to E0, E1A, and E1B interband transitions and were analyzed in frame of the Adachi's model. The interband transition parameters such as strength, threshold energy, and broadening were evaluated by using the simulated annealing algorithm. In addition, the pseudo-complex refractive index, extinction coefficient, absorption coefficient, and normal-incidence reflectivity were derived over 0.8-4.5 eV photon energy range
dc.format.extent5 p.
dc.format.mimetypeapplication/pdf
dc.identifier.idgrec645135
dc.identifier.issn0003-6951
dc.identifier.urihttps://hdl.handle.net/2445/124830
dc.language.isoeng
dc.publisherAmerican Institute of Physics
dc.relation.isformatofReproducció del document publicat a: https://doi.org/10.1063/1.4892548
dc.relation.ispartofApplied Physics Letters, 2014, vol. 105, p. 061909-1-061909-4
dc.relation.urihttps://doi.org/10.1063/1.4892548
dc.rights(c) American Institute of Physics , 2014
dc.rights.accessRightsinfo:eu-repo/semantics/openAccess
dc.sourceArticles publicats en revistes (Enginyeria Electrònica i Biomèdica)
dc.subject.classificationCristal·lografia
dc.subject.classificationEl·lipsometria
dc.subject.otherCrystallography
dc.subject.otherEllipsometry
dc.titleSpectroscopic ellipsometry study of Cu2ZnSnSe4 bulk crystals
dc.typeinfo:eu-repo/semantics/article
dc.typeinfo:eu-repo/semantics/publishedVersion

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