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Please use this identifier to cite or link to this item: https://hdl.handle.net/2445/124954

Dielectric characterization of multiferroic magnetoelectric double-perovskite Y(Ni0.5Mn0.5)O3 thin films

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We report on functional properties of Y(Ni0.5Mn0.5)O3 epitaxial thin films, growth by pulsed laser deposition, observing clear features of its ferroelectric and ferromagnetic nature at cryogenic temperature. Temperature-dependent complex impedance spectroscopy (IS) characterization has shown a dielectric anomaly around the ferromagnetic Curie temperature ( 100 K) indicative of coupling between magnetic and electric orders.

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COY, L. E., et al. Dielectric characterization of multiferroic magnetoelectric double-perovskite Y(Ni0.5Mn0.5)O3 thin films. Applied Physics Letters. 2016. Vol. 109, num. 15, pags. 152901-1-152901-5. ISSN 0003-6951. [consulted: 16 of August of 2026]. Available at: https://hdl.handle.net/2445/124954

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