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Dielectric characterization of multiferroic magnetoelectric double-perovskite Y(Ni0.5Mn0.5)O3 thin films

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dc.contributor.authorCoy, L. E.
dc.contributor.authorFina Martínez, Ignasi
dc.contributor.authorVentura, J.
dc.contributor.authorYate, Luis
dc.contributor.authorLangenberg Pérez, Eric
dc.contributor.authorPolo Trasancos, Ma. del Carmen
dc.contributor.authorFerrater Martorell, Cèsar
dc.contributor.authorVarela Fernández, Manuel, 1956-
dc.date.accessioned2018-10-01T10:14:38Z
dc.date.available2018-10-01T10:14:38Z
dc.date.issued2016-10-10
dc.date.updated2018-10-01T10:14:38Z
dc.description.abstractWe report on functional properties of Y(Ni0.5Mn0.5)O3 epitaxial thin films, growth by pulsed laser deposition, observing clear features of its ferroelectric and ferromagnetic nature at cryogenic temperature. Temperature-dependent complex impedance spectroscopy (IS) characterization has shown a dielectric anomaly around the ferromagnetic Curie temperature ( 100 K) indicative of coupling between magnetic and electric orders.
dc.format.extent16 p.
dc.format.mimetypeapplication/pdf
dc.identifier.idgrec665538
dc.identifier.issn0003-6951
dc.identifier.urihttps://hdl.handle.net/2445/124954
dc.language.isoeng
dc.publisherAmerican Institute of Physics
dc.relation.isformatofVersió postprint del document publicat a: https://doi.org/10.1063/1.4964439
dc.relation.ispartofApplied Physics Letters, 2016, vol. 109, num. 15, p. 152901-1-152901-5
dc.relation.projectIDinfo:eu-repo/grantAgreement/EC/FP7/280519/EU//NANOSELECT
dc.relation.urihttps://doi.org/10.1063/1.4964439
dc.rights(c) American Institute of Physics , 2016
dc.rights.accessRightsinfo:eu-repo/semantics/openAccess
dc.sourceArticles publicats en revistes (Física Aplicada)
dc.subject.classificationPel·lícules fines
dc.subject.classificationMaterials ferromagnètics
dc.subject.classificationFerromagnetisme
dc.subject.classificationFerroelectricitat
dc.subject.otherThin films
dc.subject.otherFerromagnetic materials
dc.subject.otherFerromagnetism
dc.subject.otherFerroelectricity
dc.titleDielectric characterization of multiferroic magnetoelectric double-perovskite Y(Ni0.5Mn0.5)O3 thin films
dc.typeinfo:eu-repo/semantics/article
dc.typeinfo:eu-repo/semantics/acceptedVersion

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