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Simulation of STEM-HAADF image contrast of Ruddlesden-Popper faulted LaNiO<sub>3</sub> thin films

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dc.contributor.authorColl Benejam, Catalina
dc.contributor.authorLópez Conesa, Lluís
dc.contributor.authorRebled, J. M. (José Manuel)
dc.contributor.authorMagén, César
dc.contributor.authorSánchez Barrera, Florencio
dc.contributor.authorFontcuberta i Griñó, Josep
dc.contributor.authorEstradé Albiol, Sònia
dc.contributor.authorPeiró Martínez, Francisca
dc.date.accessioned2018-10-02T09:34:10Z
dc.date.available2018-10-02T09:34:10Z
dc.date.issued2017-04-06
dc.date.updated2018-10-02T09:34:10Z
dc.description.abstractLaNiO3 (LNO) thin films are widely used as electrode materials. Yet, their properties greatly depend on such parameters as strain state and defect density. In this work we present a detailed structural characterization of epitaxial LNO thin films grown on LaAlO3(001). Based on scanning transmission electron microscope - high-angle annular darkfield imaging (STEM-HAADF) contrast analysis and image simulations, Ruddlesden-Popper faulted configurations, with 1/2a<111> relative displacement of defect free perovskite blocks, are atomically modeled and simulated to disentangle the variation of Z-contrast in the experimental images
dc.format.extent5 p.
dc.format.mimetypeapplication/pdf
dc.identifier.idgrec671835
dc.identifier.issn1932-7447
dc.identifier.urihttps://hdl.handle.net/2445/124987
dc.language.isoeng
dc.publisherAmerican Chemical Society
dc.relation.isformatofVersió postprint del document publicat a: https://doi.org/10.1021/acs.jpcc.6b12484
dc.relation.ispartofJournal of Physical Chemistry C, 2017, vol. 121, num. 17, p. 9300-9304
dc.relation.urihttps://doi.org/10.1021/acs.jpcc.6b12484
dc.rights(c) American Chemical Society , 2017
dc.rights.accessRightsinfo:eu-repo/semantics/openAccess
dc.sourceArticles publicats en revistes (Enginyeria Electrònica i Biomèdica)
dc.subject.classificationPel·lícules fines
dc.subject.otherThin films
dc.titleSimulation of STEM-HAADF image contrast of Ruddlesden-Popper faulted LaNiO<sub>3</sub> thin films
dc.typeinfo:eu-repo/semantics/article
dc.typeinfo:eu-repo/semantics/acceptedVersion

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