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Please use this identifier to cite or link to this item: https://hdl.handle.net/2445/115049
Characterization of semiconductor detectors for [gamma]-ray and x-ray spectrometry
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Abstract
Semiconductor detectors are routinely used in [gamma]-ray and x-ray spectrometry. Their characteriza-
tion is crucial in order to perform quantitative analysis. Three steps are needed to this end: energy
and FWHM calibration and determination of the full-energy peak effciency. In this TFG we have
performed these steps for a HPGe detector. We confirmed the very high linearity, excellent energy
resolution and high effciency of the studied spectrometer.
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Treballs Finals de Grau de Física, Facultat de Física, Universitat de Barcelona, Curs: 2017, Tutor: José M. Fernández-Varea
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BOYER LÓPEZ, Helena. Characterization of semiconductor detectors for [gamma]-ray and x-ray spectrometry. [consulted: 8 of June of 2026]. Available at: https://hdl.handle.net/2445/115049