Characterization of semiconductor detectors for [gamma]-ray and x-ray spectrometry

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dc.contributor.advisorFernández Varea, José María
dc.contributor.authorBoyer López, Helena
dc.date.accessioned2017-09-06T14:23:58Z
dc.date.available2017-09-06T14:23:58Z
dc.date.issued2017-01
dc.descriptionTreballs Finals de Grau de Física, Facultat de Física, Universitat de Barcelona, Curs: 2017, Tutor: José M. Fernández-Vareacat
dc.description.abstractSemiconductor detectors are routinely used in [gamma]-ray and x-ray spectrometry. Their characteriza- tion is crucial in order to perform quantitative analysis. Three steps are needed to this end: energy and FWHM calibration and determination of the full-energy peak effciency. In this TFG we have performed these steps for a HPGe detector. We confirmed the very high linearity, excellent energy resolution and high effciency of the studied spectrometer.eng
dc.format.extent5 p.
dc.format.mimetypeapplication/pdf
dc.identifier.urihttps://hdl.handle.net/2445/115049
dc.language.isoengeng
dc.rightscc-by-nc-nd (c) Boyer, 2017
dc.rights.accessRightsinfo:eu-repo/semantics/openAccesseng
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/es/
dc.sourceTreballs Finals de Grau (TFG) - Física
dc.subject.classificationDetectors de radiaciócat
dc.subject.classificationSemiconductorscat
dc.subject.classificationTreballs de fi de graucat
dc.subject.otherNuclear counterseng
dc.subject.otherSemiconductorseng
dc.subject.otherBachelor's theseseng
dc.titleCharacterization of semiconductor detectors for [gamma]-ray and x-ray spectrometryeng
dc.typeinfo:eu-repo/semantics/bachelorThesiseng

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