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| Issue Date | Title | Author(s) |
|---|---|---|
| 1992 | Light induced defects in thermal annealed hydrogenated amorphous silicon | Serra-Miralles, J.; Bertomeu i Balagueró, Joan; Sardin, Georges; Roch i Cunill, Carles; Asensi López, José Miguel; Andreu i Batallé, Jordi; Morenza Gil, José Luis |
| 1993 | On the determination of the interface density of states in a-Si:H/a-SiC:H multilayers | Bertomeu i Balagueró, Joan; Puigdollers i González, Joaquim; Asensi López, José Miguel; Andreu i Batallé, Jordi |
| 1995 | Crystal growth characterization of polycrystalline silicon films obtained by hot-wire chemical vapour deposition | Polo Trasancos, Ma. del Carmen; Peiró Martínez, Francisca; Cifre, J.; Bertomeu i Balagueró, Joan; Puigdollers i González, Joaquim; Andreu i Batallé, Jordi |
| 1991 | Hydrogen related effects in a-Si:H studied by photothermal deflection spectroscopy | Serra-Miralles, J.; Andreu i Batallé, Jordi; Sardin, Georges; Roch i Cunill, Carles; Asensi López, José Miguel; Bertomeu i Balagueró, Joan; Esteve Pujol, Joan |
| 1994 | Polycrystalline silicon films obtained by hot-wire chemical vapour deposition | Cifre, J.; Bertomeu i Balagueró, Joan; Puigdollers i González, Joaquim; Polo Trasancos, Ma. del Carmen; Andreu i Batallé, Jordi; Lloret, A. |
| 1995 | P-doped polycrystalline silicon films obtained at low temperature by hot-wire chemical vapor deposition | Puigdollers i González, Joaquim; Cifre, J.; Polo Trasancos, Ma. del Carmen; Bertomeu i Balagueró, Joan; Andreu i Batallé, Jordi; Lloret, A. |
| 1997 | Stress measurements in polycrystalline silicon films grown by hot-wire chemical vapor deposition | Peiró, D.; Bertomeu i Balagueró, Joan; Arrando Comas, Francesc; Andreu i Batallé, Jordi |
| 1999 | Ultrafine particles produced by plasma enhanced chemical vapor deposition -from SiH4, CH4, NH3 and B2H6 gas mixtures- for nanostructured ceramics applications | Bertrán Serra, Enric; Costa i Balanzat, Josep; Viera Mármol, Gregorio; Andújar Bella, José Luis; Canillas i Biosca, Adolf; Pascual Miralles, Esther |
| 1996 | New features of the layer-by-layer deposition of microcrystalline silicon films revealed by spectroscopic ellipsometry and high resolution transmission electron microscopy | Roca i Cabarrocas, P. (Pere); Hamma, S.; Hadjadj, A.; Bertomeu i Balagueró, Joan; Andreu i Batallé, Jordi |
| 1998 | Effect of the nanoparticles on the structure and crystallization of amorphous silicon thin films produced by rf glow discharge | Bertrán Serra, Enric; Sharma, S. N.; Viera Mármol, Gregorio; Costa i Balanzat, Josep; St'ahel, P.; Roca i Cabarrocas, P. (Pere) |
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