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Results 1-10 of 19 (Search time: 0.069 seconds).
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Issue DateTitleAuthor(s)
17-Jun-2008Efficiency and reliability enhancement of silicon nanocrystal field-effect luminescence from nitride-oxide gate stacksPerálvarez Barrera, Mariano José; Carreras, Josep; Barreto, Jorge; Morales, A. (Ángel); Domínguez, Carlos (Domínguez Horna); Garrido Fernández, Blas
1998Local noise analysis of a Schottky contact: combined thermionic-emissiondiffusion theoryGomila Lluch, Gabriel; Bulashenko, Oleg; Rubí Capaceti, José Miguel
1998Extension of the impedance field method to the noise analysis of a semiconductor junction: Analytical approachGomila Lluch, Gabriel; Bulashenko, Oleg; Rubí Capaceti, José Miguel; Kochelap, V. A. (Viacheslav Aleksandrovich)
2007Nanoscale electrical conductivity of the purple membrane monolayerCasuso Páramo, Ignacio; Fumagalli, Laura, 1959-; Samitier i Martí, Josep; Padrós, Esteve; Reggiani, L. (Lino), 1941-; Akimov, Vladimir; Gomila Lluch, Gabriel
15-Jun-1998Surface roughness in InGaAs Channels of HEMT devices depending on the growth temperature: strain induced or due to alloy decompositionPeiró Martínez, Francisca; Cornet i Calveras, Albert; Morante i Lleonart, Joan Ramon; Beck, M.; Py, M. A.
15-Jul-1999Effects of the epitaxial layer thickness on the noise properties of Schottky barrier diodesGomila Lluch, Gabriel; Bulashenko, Oleg
Sep-2000Properties of nitrogen doped silicon films deposited by low-pressure chemical vapor deposition from silane and ammoniaTemple Boyer, Pierre; Jalabert, L.; Masarotto, L.; Alay, Josep Lluís; Morante i Lleonart, Joan Ramon
2-Sep-2005Conduction mechanisms and charge storage in Si-nanocrystals metal-oxide-semiconductor memory devices studied with conducting atomic force microscopyPorti i Pujal, Marc; Avidano, M.; Nafría i Maqueda, Montserrat; Aymerich Humet, Xavier; Carreras, Josep; Garrido Fernández, Blas
1-Sep-2000Shot-noise suppression in Schottky barrier diodesGomila Lluch, Gabriel; Reggiani, L. (Lino), 1941-; Rubí Capaceti, José Miguel
2004A reusable smart interface for gas sensor resistance measurementMerino Panadés, José Luis; Bota Ferragut, Sebastián Antonio; Casanova Mohr, Raimon; Diéguez Barrientos, Àngel; Cané i Ballart, Carles; Samitier i Martí, Josep