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Issue Date | Title | Author(s) |
---|---|---|
2001 | Optoelectronic studies in nanocrystalline silicon Schottky diodes obtained by Hot-Wire Chemical Vapour Deposition | Voz Sánchez, Cristóbal; Soler Vilamitjana, David; Fonrodona Turon, Marta; Bertomeu i Balagueró, Joan; Asensi López, José Miguel; Andreu i Batallé, Jordi |
2000 | Microcrystalline silicon thin film transistors obtained by Hot-Wire CVD | Puigdollers i González, Joaquim; Orpella, Albert; Alcubilla González, Ramón; Dosev, D.; Pallarés Curto, Jordi; Peiró, D.; Voz Sánchez, Cristóbal; Bertomeu i Balagueró, Joan; Andreu i Batallé, Jordi; Marsal Garví, Lluís F. (Lluís Francesc) |
2000 | Microdoping compensation of microcrystalline silicon obtained by Hot-Wire Chemical Vapour Deposition | Voz Sánchez, Cristóbal; Peiró, D.; Fonrodona Turon, Marta; Soler Vilamitjana, David; Bertomeu i Balagueró, Joan; Andreu i Batallé, Jordi |
2003 | Surface passivation of crystalline silicon by Cat-CVD amorphous and nanocrystalline thin silicon films | Voz Sánchez, Cristóbal; Martin Garcia, Isidro; Orpella, Albert; Puigdollers i González, Joaquim; Vetter, M.; Alcubilla González, Ramón; Soler Vilamitjana, David; Fonrodona Turon, Marta; Bertomeu i Balagueró, Joan; Andreu i Batallé, Jordi |
2003 | Substrate influence on the properties of doped thin silicon layers grown by Cat-CVD | Soler Vilamitjana, David; Fonrodona Turon, Marta; Voz Sánchez, Cristóbal; Asensi López, José Miguel; Bertomeu i Balagueró, Joan; Andreu i Batallé, Jordi |
2001 | Kelvin probe measurements of microcrystalline silicon on a nanometer scale using SFM | Breymesser, A.; Schlosser, V.; Peiró, D.; Voz Sánchez, Cristóbal; Bertomeu i Balagueró, Joan; Andreu i Batallé, Jordi; Summhammer, J. |