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Issue Date | Title | Author(s) |
---|---|---|
2013 | Spatial mapping of exciton lifetimes in single ZnO nanowires | Reparaz, J. S.; Callsen, G.; Wagner, M. R.; Güell Vilà, Frank; Morante i Lleonart, Joan Ramon; Sotomayor Torres, C. M.; Hoffmann, A. |
30-Aug-2013 | Silicon quantum dots embedded in a SiO2 matrix: From structural study to carrier transport properties | Garcia-Castello, Nuria; Illera Robles, Sergio; Guerra, Roberto; Prades García, Juan Daniel; Ossicini, Stefano; Cirera Hernández, Albert |
2014 | Multiwavelength excitation Raman scattering study of polycrystalline kesterite Cu2ZnSnS4 thin films | Dimitrievska, Mirjana; Fairbrother, Andrew; Fontané Sánchez, Xavier; Jawhari, Tariq; Izquierdo Roca, Victor; Saucedo Silva, Edgardo; Pérez Rodríguez, Alejandro |
13-Sep-2010 | Energy transfer mechanism and Auger effect in Er3+ coupled silicon nanoparticle samples | Pitanti, Alessandro; Navarro Urrios, Daniel; Prtljaga, Nikola; Daldosso, Nicola; Gourbilleau, Fabrice; Rizk, Richard; Garrido Fernández, Blas; Pavesi, Lorenzo |
17-Jun-2008 | Efficiency and reliability enhancement of silicon nanocrystal field-effect luminescence from nitride-oxide gate stacks | Perálvarez Barrera, Mariano José; Carreras, Josep; Barreto, Jorge; Morales, A. (Ángel); Domínguez, Carlos (Domínguez Horna); Garrido Fernández, Blas |
20-Jan-2010 | Towards population inversion of electrically pumped Er ions sensitized by Si nanoclusters | Jambois, Olivier; Gourbilleau, Fabrice; Kenyon, Anthony J.; Montserrat i Martí, Josep; Rizk, Richard; Garrido Fernández, Blas |
3-Mar-2008 | Direct modulation of electroluminescence from silicon nanocrystals beyond radiative recombination rates | Carreras, Josep; Albiol i Cobos, Jordi; Garrido Fernández, Blas; Bonafos, Caroline; Montserrat i Martí, Josep |
1998 | Local noise analysis of a Schottky contact: combined thermionic-emissiondiffusion theory | Gomila Lluch, Gabriel; Bulashenko, Oleg; Rubí Capaceti, José Miguel |
1997 | Relation for the nonequilibrium population of the interface states: effects on the bias dependence of the ideality factors | Gomila Lluch, Gabriel; Rubí Capaceti, José Miguel |
1998 | Extension of the impedance field method to the noise analysis of a semiconductor junction: Analytical approach | Gomila Lluch, Gabriel; Bulashenko, Oleg; Rubí Capaceti, José Miguel; Kochelap, V. A. (Viacheslav Aleksandrovich) |
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