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Results 21-30 of 51 (Search time: 0.013 seconds).
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Issue DateTitleAuthor(s)
1991Ellipsometric study of a-Si:H thin films deposited by square wave modulated rf glow dischargeLloret, A.; Bertrán Serra, Enric; Andújar Bella, José Luis; Canillas i Biosca, Adolf; Morenza Gil, José Luis
1990In situ spectroellipsometric study of the nucleation and growth of amorphous siliconCanillas i Biosca, Adolf; Bertrán Serra, Enric; Andújar Bella, José Luis; Drévillon, B.
1986Spectroscopic ellipsometry study of the In1-x Gax Asy P1-y / InP Heterojunctions grown by metalorganic chemical-vapor depositionDrévillon, B.; Bertrán Serra, Enric; Alnot, P.; Olivier, J.; Razeghi, M.
1992Properties of amorphous silicon thin films grown in square wave modulated silane rf discharges.Andújar Bella, José Luis; Bertrán Serra, Enric; Canillas i Biosca, Adolf; Campmany i Guillot, Josep, 1966-; Serra-Miralles, J.; Roch i Cunill, Carles; Lloret, A.
1991Effect of substrate temperature on deposition rate of rf plasma-deposited hydrogenated amorphous silicon thin filmsAndújar Bella, José Luis; Bertrán Serra, Enric; Canillas i Biosca, Adolf; Campmany i Guillot, Josep, 1966-; Morenza Gil, José Luis
15-Oct-2001Polymorphous Si thin films from radio frequency plasmas of SiH4 diluted in Ar: A study by transmission electron microscopy and Raman spectroscopyViera Mármol, Gregorio; Huet, S.; Bertrán Serra, Enric; Boufendi, L.
23-Dec-2004Influence of the dipolar interactions in the magnetization reversal asymmetry of hard-soft magnetic ribbonsRivas Ardisana, Montserrat; García Díaz, José Ángel; Tejedor Gancedo, Marcos; Bertrán Serra, Enric; Céspedes, J. G.
Aug-1997In situ fast ellipsometric analysis of repetitive surface phenomenaCampmany i Guillot, Josep, 1966-; Costa i Balanzat, Josep; Canillas i Biosca, Adolf; Andújar Bella, José Luis; Bertrán Serra, Enric
5-Aug-2009Plasma parameters of pulsed-dc discharges in methane used to deposit diamondlike carbon filmsCorbella Roca, Carles; Rubio Roy, Miguel; Bertrán Serra, Enric; Andújar Bella, José Luis
15-Oct-2002Atomic structure of the nanocrystalline Si particles appearing in nanostructured Si thin films produced in low-temperature radiofrequency plasmasViera Mármol, Gregorio; Mikikian, M.; Bertrán Serra, Enric; Roca i Cabarrocas, P. (Pere); Boufendi, L.