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| Issue Date | Title | Author(s) |
|---|---|---|
| 1-Apr-2014 | Mueller matrix microscope with a dual continuous rotating compensator setup and digital demodulation | Arteaga Barriel, Oriol; Baldrís Calmet, Marta; Antó Roca, Joan; Canillas i Biosca, Adolf; Pascual Miralles, Esther; Bertrán Serra, Enric |
| Mar-1987 | Influence of pressure and radio frequency power on deposition rate and structural properties of hydrogenated amorphous silicon thin films prepared by plasma deposition | Andújar Bella, José Luis; Bertrán Serra, Enric; Canillas i Biosca, Adolf; Roch i Cunill, Carles; Morenza Gil, José Luis |
| 1999 | Ultrafine particles produced by plasma enhanced chemical vapor deposition -from SiH4, CH4, NH3 and B2H6 gas mixtures- for nanostructured ceramics applications | Bertrán Serra, Enric; Costa i Balanzat, Josep; Viera Mármol, Gregorio; Andújar Bella, José Luis; Canillas i Biosca, Adolf; Pascual Miralles, Esther |
| 1991 | Ellipsometric study of a-Si:H thin films deposited by square wave modulated rf glow discharge | Lloret, A.; Bertrán Serra, Enric; Andújar Bella, José Luis; Canillas i Biosca, Adolf; Morenza Gil, José Luis |
| 1990 | In situ spectroellipsometric study of the nucleation and growth of amorphous silicon | Canillas i Biosca, Adolf; Bertrán Serra, Enric; Andújar Bella, José Luis; Drévillon, B. |
| 1992 | Properties of amorphous silicon thin films grown in square wave modulated silane rf discharges. | Andújar Bella, José Luis; Bertrán Serra, Enric; Canillas i Biosca, Adolf; Campmany i Guillot, Josep, 1966-; Serra-Miralles, J.; Roch i Cunill, Carles; Lloret, A. |
| 1991 | Effect of substrate temperature on deposition rate of rf plasma-deposited hydrogenated amorphous silicon thin films | Andújar Bella, José Luis; Bertrán Serra, Enric; Canillas i Biosca, Adolf; Campmany i Guillot, Josep, 1966-; Morenza Gil, José Luis |
| Aug-1997 | In situ fast ellipsometric analysis of repetitive surface phenomena | Campmany i Guillot, Josep, 1966-; Costa i Balanzat, Josep; Canillas i Biosca, Adolf; Andújar Bella, José Luis; Bertrán Serra, Enric |
| 17-Dec-2010 | Detection and characterization of single nanoparticles by interferometric phase modulated ellipsometry | Barroso, F.; Bosch i Puig, Salvador; Tort Escribà, Núria; Arteaga Barriel, Oriol; Sancho i Parramon, Jordi; Jover, Eric; Bertrán Serra, Enric; Canillas i Biosca, Adolf |
| 22-Oct-2015 | Optical security verification by synthesizing thin films with unique polarimetric signatures | Carnicer González, Arturo; Arteaga Barriel, Oriol; Pascual Miralles, Esther; Canillas i Biosca, Adolf; Vallmitjana i Rico, Santiago; Javidi, Bahram; Bertrán Serra, Enric |
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